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| File | File in archive | Date | Context | Size | DLs | Mfg | Model |
| Making 14-Points Pulse Characterization Measurements Using the Keysight 8990B Peak Power Analyzer 59 | Making 14-Points Pulse Characterization Measurements Using the Keysight 8990B Peak Power Analyzer 59 | 24/05/21 | Keysight Technologies Making 14-Points P | 1203 kB | 3 | Agilent | Making 14-Points Pulse Characterization Measurements Using the Keysight 8990B Peak Power Analyzer 59 |
| 5992-0284EN eDP 1.4 Electrical Performance and Characterization Software - Data Sheet c20141118 [22] | 5992-0284EN eDP 1.4 Electrical Performance and Characterization Software - Data Sheet c20141118 [22] | 25/08/21 | Keysight Technologies eDP 1.4 Electrical | 1739 kB | 2 | Agilent | 5992-0284EN eDP 1.4 Electrical Performance and Characterization Software - Data Sheet c20141118 [22] |
| 2962_Semiconductor_Manufacturing.pdf | 2962_Semiconductor_Manufacturing.pdf | 22/03/20 | A | 397 kB | 3 | Keithley | 2962 Semiconductor Manufacturing |
| 5989-4839EN.pdf | 5989-4839EN.pdf | 20/03/20 | Agilent PNA Microwave Network Analyzers | 1527 kB | 0 | HP | 5989-4839EN |
| 5989-7894EN English _ 2013-10-28 _ PDF 1.46 MB c20140603 [12].pdf | 5989-7894EN English _ 2013-10-28 _ PDF 1.46 MB c20140603 [12].pdf | 21/01/20 | Keysight Technologies Eight Hints for Be | 5674 kB | 7 | Agilent | 5989-7894EN English 2013-10-28 PDF 1.46 MB c20140603 [12] |
| 5988-6522EN.pdf | 5988-6522EN.pdf | 16/02/20 | Agilent In-Fixture Characterization Usin | 2902 kB | 0 | HP | 5988-6522EN |
| an_95-1.pdf | an_95-1.pdf | 06/03/20 | Test & Measurement | 1295 kB | 0 | HP | an 95-1 |
| 5950-2954.pdf | 5950-2954.pdf | 29/08/20 | 1876 kB | 11 | Agilent | 5950-2954 | |
| 4200 CV AN.pdf | 4200 CV AN.pdf | 15/03/20 | 355 kB | 3 | Keithley | 4200 CV AN | |
| 25443.pdf | 25443.pdf | 11/03/20 | AMD C | 158 kB | 3 | AMD | 25443 |
| IVChrzDIodes2450_AN.pdf | IVChrzDIodes2450_AN.pdf | 28/11/19 | 490 kB | 8 | Keithley | IVChrzDIodes2450 AN | |
| 5991-2443EN B1500A Semiconductor Device Analyzer - Brochure c20141030 [16].pdf | 5991-2443EN B1500A Semiconductor Device Analyzer - Brochure c20141030 [16].pdf | 26/08/20 | Keysight Technologies B1500A Semiconduct | 1756 kB | 4 | Agilent | 5991-2443EN B1500A Semiconductor Device Analyzer - Brochure c20141030 [16] |
| an_243-3.pdf | an_243-3.pdf | 06/03/20 | 429 kB | 0 | HP | an 243-3 | |
| 5990-9784EN Tips and Techniques for Accurate Characterization of 28 Gb s Designs - Application Note | 5990-9784EN Tips and Techniques for Accurate Characterization of 28 Gb s Designs - Application Note | 18/08/21 | Keysight Technologies Tips and Technique | 2923 kB | 1 | Agilent | 5990-9784EN Tips and Techniques for Accurate Characterization of 28 Gb s Designs - Application Note |
| 5952-1130a.pdf | 5952-1130a.pdf | 09/03/20 | 3171 kB | 1 | HP | 5952-1130a | |
| std26nf10.pdf | std26nf10.pdf | 01/08/20 | 392 kB | 0 | ST | std26nf10 | |
| 5991-2524EN Optimizing On-Wafer Noise Figure Measurements up to 67 GHz - Application Note c20140917 | 5991-2524EN Optimizing On-Wafer Noise Figure Measurements up to 67 GHz - Application Note c20140917 | 01/07/21 | Keysight Technologies Optimizing On-Wafe | 2563 kB | 1 | Agilent | 5991-2524EN Optimizing On-Wafer Noise Figure Measurements up to 67 GHz - Application Note c20140917 |
| Tips for Making Low Current Measurements with an Oscilloscope and Current Probe 5989-7529EN c2014071 | Tips for Making Low Current Measurements with an Oscilloscope and Current Probe 5989-7529EN c2014071 | 22/10/21 | Keysight Technologies Tips for Making Lo | 1289 kB | 2 | Agilent | Tips for Making Low Current Measurements with an Oscilloscope and Current Probe 5989-7529EN c2014071 |
| Low_level_AN.pdf | Low_level_AN.pdf | 07/02/20 | 638 kB | 1 | Keithley | Low level AN | |
| DC_DC Characterization2600B AppNote.pdf | DC_DC Characterization2600B AppNote.pdf | 27/12/19 | 958 kB | 1 | Keithley | DC DC Characterization2600B AppNote | |